POLARIZING MICROSCOPE
Polarizers are positioned above and below the sample. A birefringent sample modifies the polarized light, which makes it visible even when it is transparent. For certain samples, it also allows to...
View ArticleDARK FIELD AND PHASE CONTRAST
The dark field microscope produces a light cone, which reaches the objective only when it is scattered by the sample. This reinforces the image contrast. The phase contrast microscope modifies the...
View ArticleFLUORESCENT AND CONFOCAL
In these microscopies, the sample contains fluorescent molecules. These molecules are excited by a light beam and their fluorescence is then detected. In the confocal microscope, the excitation is...
View ArticleSCANNING ELECTRON MICROSCOPE SEM
An electron beam is focused on the surface of the sample that then emits other electrons and X-rays. The detection of these secondary electrons allows deducing the topography while the X-rays analysis...
View ArticleTRANSMISSION ELECTRON MICROSCOPE TEM
A high-energy electron beam is sent through the thin sample. Using adapted lenses, one can get a magnified image of the sample down to atomic resolution. Measuring the loss of energy of these electrons...
View ArticleSCANNING TUNNELING MICROSCOPE STM
A metallic tip is positioned very close to the surface of the metal. A voltage applied between the tip and the surface creates a tunneling current. By varying the tip position or the voltage, one can...
View ArticleATOMIC FORCE MICROSCOPE AFM
A tip at the end of a cantilever is brought close to the surface of the sample. The surface creates a force on the tip, which deflects the cantilever. The measure of this deviation allows to deduce the...
View Article